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Surface Analysis of Polymers by XPS & Static SIMS 〖大學理工醫〗AFC

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    商品狀況
    二手品
    所在地區
    桃園市
    商品編號
    100881108507
    ISBN
    0521352223
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    出版日期

     1998年

     

     

    內容簡介 

     The behaviour of polymer and plastic surfaces is critical to a variety of applications of these materials. This in turn is governed by the chemical structure and composition of the outermost molecular layers. This book describes the instrumentation, physical bases and application of XPS and SSIMS, two of the most powerful techniques for polymer surface chemical analysis to have emerged in the past 25 years.



    This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.

     

     

     

     

     

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    ISBN:0521352223


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